Enhanced TDS
Identification & Functionality
- Chemical Family
- Function
- Solvent,Cleaning Agent
- Product Functions
- Technologies
- Product Families
Features & Benefits
- Product Features
- Product Features
- Organic base
- High purity, low trace metal
- TMAH replacement
- Available at 45 wt%
- Water or solvent based
- Low metal corrosion
- CMP slurries and pCMP cleans
- PERR
Applications & Uses
- Product End Uses
- Markets
- Applications
Properties
- Physical Form
- Soluble In
Regulatory & Compliance
- Chemical Inventories
Technical Details & Test Data
- pH - Concentration Dependence

Alkalinity: TMAH > Choline > THEMAH
- TiN Etch with Hydrogen Peroxide

- At appropriate pH and concentration, E-GRADE® THEMAH with H₂O₂ can be used for titanium nitride (TiN) strip (etch rate >20 nm/min), which offers wider and more controllable strip rate window comparing to TMAH.
- Test Data

- Cu wafer treated with E-GRADE® THEMAH demonstrated smoother surface compared to Cu treated with TMAH. (pH 12.8, 30°C for 30 min)

- Silicon wafers, treated with E-GRADE® THEMAH, demonstrate significant reductions in reflectivity and improvement in uniformity when compared to wafers treated with TMAH.
- This texturization reduces light reflection and improves absorption for photovoltaic devices.
Packaging & Availability
- Regional Availability
Other
- Appearance (SDS)
- Liquid
- Color (SDS)
- Colorless
- Odor (SDS)
- Amine like
- Chemical Properties
Value Units Test Method / Conditions pH 12.9 - - Physical Properties
Value Units Test Method / Conditions Molecular Weight 181.0 g/mol